Corrosion Protection of Materials
Influence of Oxidation on the Stability of the Forward Voltage of Power Diodes in Disk-Type Design
Andrii Kryvous, Kristina Snizhna, Tymofii Kryvous, Gennadii Snizhnoi
National University “Zaporizhzhia Polytechnic”, Ukraine
PDFKeywords
metal oxidation, power diode, forward voltage, semiconductor
Abstract
The influence of oxide films of various metals used in the clamping structures of contacts of power semiconductor devices on the forward voltage UFM has been studied. It has been established that the greatest effect on the increase of the forward voltage UFM is exerted by the oxidation of molybdenum disks, provided by the design of the power diode as a thermal compensator.